Ev2rev 52011-02-15IEC 62258

die step dimension y

0112/2///61360_4#AAD071

nominal value of the step interval of die patterns on a wafer measured in the direction of the y axis of the coordinate system established for the wafer

Used by classes: 1

property

Also appears in1#

Entities with the same name in other dictionaries:

IEC CDD reference dictionaryAAD071Propertie

Code: AAD071
Data type: LEVEL(NOM) OF REAL_MEASURE_TYPE
Unit: UAA726 UAA726

Used by classes (1)

AAA302die device

All properties25#

Version: 2
Revision: 5
Preferred name: die step dimension y
Short name: E
Definition: nominal value of the step interval of die patterns on a wafer measured in the direction of the y axis of the coordinate system established for the wafer
Definition source: IEC 62258
Remark: The width of the die will normally be closely related to the step interval but the precise value depends on width of saw cuts, tolerances etc.
Definition class: 0112/2///61360_4#AAA302die device
Unit structure: m
Drawing reference: NR3..3.3ES2
Initial value: 0112/2///62720#UAA726 UAA726
Responsible committee: SC3D
Publisher: IEC
Published in: IEC 61360-4
Published in: NON_DEPENDENT_P_DET
Status level: Standard
Version release date: 2015-08-17
Revision release date: 2011-02-15
Version initiation date: 2015-08-17
Original definition date: 2003-02-21
MDC_P001_6: 0112/2///61360_4#AAD071die step dimension y
MDC_P008_2: DAE002
MDC_P022: LEVEL(NOM) OF REAL_MEASURE_TYPE
MDC_P025_1: E
MDC_P040: T03