index typev2rev 62011-02-15IEC 62258
wafer index orientation
0112/2///61360_4#AAD167
nominal angle between the x-axis for the die and a radius drawn from the centre of the wafer to the mid-point of the index feature
- Used by classes
- 1
Also appears in1#
Entities with the same name in other dictionaries:
- Code
AAD167- Data type
- LEVEL(NOM) OF INT_MEASURE_TYPE
- Unit
- UAA024 UAA024
All properties24#
- Version
- 2
- Revision
- 6
- Preferred name
- wafer index orientation
- Short name
- index type
- Definition
- nominal angle between the x-axis for the die and a radius drawn from the centre of the wafer to the mid-point of the index feature
- Definition source
- IEC 62258
- Note
- The angle shall be given to the nearest degree as a positive integer less than 360 measuring in a clockwise direction from the x-axis of the die
- Definition class
- 0112/2///61360_4#AAA302die device
- Unit structure
- °
- Drawing reference
- NR1..3
- Initial value
- 0112/2///62720#UAA024 UAA024
- Responsible committee
- SC3D
- Publisher
- IEC
- Published in
- 3D/ggg
- Published in
- NON_DEPENDENT_P_DET
- Status level
- Standard
- Version release date
- 2015-08-17
- Revision release date
- 2011-02-15
- Version initiation date
- 2015-08-17
- Original definition date
- 2003-04-01
- MDC_P022
- LEVEL(NOM) OF INT_MEASURE_TYPE
- MDC_P025_1
- α
- MDC_P040
- T01