n_die(ret)v2rev 52011-02-15IEC 62258
reticule gross die count
0112/2///61360_4#AAD170
nominal gross number of whole and viable die in a single reticule on a wafer
- Used by classes
- 1
Also appears in1#
Entities with the same name in other dictionaries:
- Code
AAD170- Data type
- LEVEL(NOM) OF INT_MEASURE_TYPE
- Unit
- UAA915 UAA915
All properties23#
- Version
- 2
- Revision
- 5
- Preferred name
- reticule gross die count
- Short name
- n_die(ret)
- Definition
- nominal gross number of whole and viable die in a single reticule on a wafer
- Definition source
- IEC 62258
- Definition class
- 0112/2///61360_4#AAA302die device
- Unit structure
- 1
- Drawing reference
- NR1..6
- Initial value
- 0112/2///62720#UAA915 UAA915
- Responsible committee
- SC3D
- Publisher
- IEC
- Published in
- 3D/ggg
- Published in
- NON_DEPENDENT_P_DET
- Status level
- Standard
- Version release date
- 2015-08-17
- Revision release date
- 2011-02-15
- Version initiation date
- 2015-08-17
- Original definition date
- 2003-04-01
- MDC_P022
- LEVEL(NOM) OF INT_MEASURE_TYPE
- MDC_P025_1
- n_die(ret)}
- MDC_P040
- Q56