Normal process conditions [1]
properties characterizing the range of process conditions within which a device is designed to operate within specified performance limits
Hierarchy#
Ancestors (top) → ABC451 (highlighted) → subclasses and powertype instances. Capped at 12 each; see the full lists in the sections below.
Higher level classes3#
Declared properties40#
highest dynamic viscosity for which a device is or should be designed to operate within its specified limits
highest kinematic viscosity for which a device is or should be designed to operate within its specified limits
lowest fluid velocity for which a device is or should be designed to operate within its specified limits
highest fluid velocity for which a device is or should be designed to operate within its specified limits
maximum permanent loss of pressure over the primary element at upper range-limit of flow rate for which the device has or should be designed
dynamic viscosity on the basis of which a pressure drop statement is valid
states of the process material that the device is or should be designed to
highest rate of change of process temperature for which a device is or should be designed to operate within its specified limits
maximum permissible grain size of impurities for normal operation of a device
lowest process temperature for which a device is or should be designed to operate within its specified limits
highest process temperature for which a device is or should be designed to operate within its specified limits
lowest absolute pressure of a process for which a device is or should be designed to operate within its specified limits
highest absolute pressure of a process for which a device is or should be designed to operate within its specified limits
lowest electrical conductivity for which a device is or should be designed to operate within its specified limits
lowest thermal conductivity for which a device is or should be designed to operate within its specified limits
lowest actual density for which a device is or should be designed to operate within its specified limits
highest actual density for which a device is or should be designed to operate within its specified limits
lowest Reynolds number for which a device is or should be designed to operate within its specified limits
highest Reynolds number for which a device is or should be designed to operate within its specified limits
highest gas volume fraction for which a device is or should be designed to operate within its specified limits
lowest gauge pressure of a process for which a device is or should be designed to operate within its specified limits
highest gauge pressure of a process for which a device is or should be designed to operate within its specified limits
lowest velocity of sound for which a device is or should be designed to operate within its specified limits
highest velocity of sound for which a device is or should be designed to operate within its specified limits
highest electrical conductivity for which a device is or should be designed to operate within its specified limits
highest thermal conductivity for which a device is or should be designed to operate within its specified limits
lowest gas volume fraction for which a device is or should be designed to operate within its specified limits
lowest solids content expressed as mass fraction for which a device is or should be designed to operate within its specified limits
highest solids content expressed as mass fraction for which a device is or should be designed to operate within its specified limits
lowest differential pressure of a process for which a device is or should be designed to operate within its specified limits
highest differential pressure of a process for which a device is or should be designed to operate within its specified limits
lowest relative permittivity for which a device is or should be designed to operate within its specified limits
highest pressure that a pressure instrument can withstand in the case of submersible usage, operating within its specifications
smallest particle size for which a device is or should be designed to operate within its specified limits
greatest particle size for which a device is or should be designed to operate within its specified limits
highest relative permittivity for which a device is or should be designed to operate within its specified limits
highest rate of level change for which a device is or should be designed to operate within its specified limits
lowest emissivity for which a device is or should be designed to operate within its specified limits
highest emissivity for which a device is or should be designed to operate within its specified limits
plain text describing a process condition
Subclasses#
No subclasses
This class is a leaf — no other classes inherit from it.
Metadata#
- Version
- 2
- Revision
- 1
- Status
- Standard
- Responsible committee
- SC65E – IEC 61987
- Change request
C00018- Dates
- Original: 2013-08-27
- Current version: 2016-05-24
- Current revision: 2016-05-24
Full source data#
Every key from the original .xls export, including multilingual variants, status, publisher, committee, and workbook-specific codes.
Raw properties (25 keys from source .xls) — click to expand
- C002
- C00018
- C016
- Standard
- C017.de
- 0
- C017.fr
- 0
- C018.de
- 2015-04-17
- C018.fr
- 2015-04-17
- C019.de
- Mr. W. Hartmann
- C019.fr
- Mr. W. Hartmann
- MDC_P001_5
- 0112/2///61987#ABC451
- MDC_P002_1
- 2
- MDC_P002_2
- 1
- MDC_P003_0
- 2018-03-28
- MDC_P003_1
- 2013-08-27
- MDC_P003_2
- 2016-05-24
- MDC_P003_3
- 2016-05-24
- MDC_P004.de
- Prozessbedingungen (Normalbedingungen) [1]
- MDC_P004.en
- Normal process conditions [1]
- MDC_P004.fr
- Conditions de processus normales [1]
- MDC_P006.de
- Merkmale, die den Bereich der Prozessbedingungen kennzeichnen, für die ein Gerät ausgelegt ist, damit es innerhalb der spezifizierten Grenzen arbeitet
- MDC_P006.en
- properties characterizing the range of process conditions within which a device is designed to operate within specified performance limits
- MDC_P006.fr
- propriétés caractérisant l’étendue de conditions de processus dans lesquelles un appareil est conçu pour fonctionner dans les limites de performance spécifiées (version de bloc 1)
- MDC_P010
- 0112/2///61987#ABV501
- MDC_P011
- ITEM_CLASS
- MDC_P012
- SC65E – IEC 61987
- MDC_P014
- {0112/2///61987#ABH446,0112/2///61987#ABA954,0112/2///61987#ABB184,0112/2///61987#ABA955,0112/2///61987#ABB185,0112/2///61987#ABB997,0112/2///61987#ABB998,0112/2///61987#ABD425,0112/2///61987#ABA918,0112/2///61987#ABA919,0112/2///61987#ABA598,0112/2///61987#ABB055,0112/2///61987#ABB056,0112/2///61987#ABA110,0112/2///61987#ABA111,0112/2///61987#ABA112,0112/2///61987#ABA114,0112/2///61987#ABB057,0112/2///61987#ABB058,0112/2///61987#ABD422,0112/2///61987#ABD428,0112/2///61987#ABB027,0112/2///61987#ABB233,0112/2///61987#ABB035,0112/2///61987#ABB259,0112/2///61987#ABB231,0112/2///61987#ABB232,0112/2///61987#ABD439,0112/2///61987#ABD440,0112/2///61987#ABB433,0112/2///61987#ABB059,0112/2///61987#ABB434,0112/2///61987#ABB435,0112/2///61987#ABD426,0112/2///61987#ABD427,0112/2///61987#ABA642,0112/2///61987#ABA115,0112/2///61987#ABA116,0112/2///61987#ABD429,0112/2///61987#ABA297}
Version history3#
IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.