Reference process conditions
properties characterizing the reference conditions of the process under which the performance of a device was tested
Hierarchy#
Ancestors (top) → ABC574 (highlighted) → subclasses and powertype instances. Capped at 12 each; see the full lists in the sections below.
Higher level classes3#
Declared properties16#
process material with which the performance of a device was tested
temperature of process material at which the performance of a device was tested
absolute pressure of the process material at which the performance of a device was tested
pressure drop across the flowmeter at which the performance of a device was tested
gauge pressure of the process material at which the performance of a device was tested
standard on which a stated accuracy value is based
inside diameter of a pipe which the performance of a device was tested
density at which the performance of a device was tested
electrical conductivity of the process material with which the performance of a device was tested
relative permittivity of the process material with which the performance of a device was tested
dynamic viscosity of the process material with which the performance of a device was tested
grain size at which the performance of a device was tested
type of tank at which the performance of a device was tested
conditions of the vessel at which the performance of a device was tested
downstream straight length at which the performance of a device was tested, expressed in units of pipe diameter
upstream straight length at which the performance of a device was tested, expressed in units of pipe diameter
Subclasses#
No subclasses
This class is a leaf — no other classes inherit from it.
Metadata#
- Version
- 2
- Revision
- 1
- Status
- Standard
- Responsible committee
- SC65E – IEC 61987
- Change request
C00004- Dates
- Original: 2013-08-27
- Current version: 2016-05-24
- Current revision: 2016-05-24
Full source data#
Every key from the original .xls export, including multilingual variants, status, publisher, committee, and workbook-specific codes.
Raw properties (25 keys from source .xls) — click to expand
- C002
- C00004
- C016
- Standard
- C017.de
- 0
- C017.fr
- 0
- C018.de
- 2014-12-12
- C018.fr
- 2013-08-27
- C019.de
- Mr. W. Hartmann
- C019.fr
- Mr. W. Hartmann
- MDC_P001_5
- 0112/2///61987#ABC574
- MDC_P002_1
- 2
- MDC_P002_2
- 1
- MDC_P003_0
- 2018-03-28
- MDC_P003_1
- 2013-08-27
- MDC_P003_2
- 2016-05-24
- MDC_P003_3
- 2016-05-24
- MDC_P004.de
- Referenz-Prozessbedingungen
- MDC_P004.en
- Reference process conditions
- MDC_P004.fr
- Conditions de processus de référence
- MDC_P006.de
- Merkmale, die die Referenzgrößen des Prozesses kennzeichnen, bei denen die Leistung des Geräts bestimmt wurde
- MDC_P006.en
- properties characterizing the reference conditions of the process under which the performance of a device was tested
- MDC_P006.fr
- propriétés caractérisant les conditions de référence du processus dans lesquelles les performances d’un appareil sont soumises à essai
- MDC_P010
- 0112/2///61987#ABV501
- MDC_P011
- ITEM_CLASS
- MDC_P012
- SC65E – IEC 61987
- MDC_P014
- {0112/2///61987#ABB001,0112/2///61987#ABB002,0112/2///61987#ABB003,0112/2///61987#ABB188,0112/2///61987#ABB004,0112/2///61987#ABB641,0112/2///61987#ABB643,0112/2///61987#ABB644,0112/2///61987#ABB645,0112/2///61987#ABD453,0112/2///61987#ABD537,0112/2///61987#ABD536,0112/2///61987#ABD454,0112/2///61987#ABD455,0112/2///61987#ABB454,0112/2///61987#ABB278}
Version history3#
IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.