Influence of external quantities expressed for point level
properties characterizing the influence of external quantities for point level measurement devices that are not the subject of the measurement but whose change affects the relationship between the indication and the result of the measurement
Hierarchy#
Ancestors (top) → ABE984 (highlighted) → subclasses and powertype instances. Capped at 12 each; see the full lists in the sections below.
Higher level classes3#
Declared properties14#
change in output of a point level measuring device caused by a change in ambient temperature with respect to reference conditions, expressed as the average error across the specified ambient temperature range
change in output of a point level measuring device caused by a change in ambient temperature with respect to reference conditions, expressed as the maximum error across the specified ambient temperature range
change in output of a point level measuring device caused by a change in process temperature with respect to reference conditions, expressed as the average error across the specified process temperature range
change in output of a point level measuring device caused by a change in process temperature with respect to reference conditions, expressed as the maximum error across the specified process temperature range
change in output of a point level measuring device caused by a change in process pressure with respect to reference conditions, expressed as the average error across the specified process pressure range
change in output of a point level measuring device caused by a change in process pressure with respect to reference conditions, expressed as the maximum error across the specified process pressure range
change in output of a point level measuring device caused by a change in process density with respect to reference conditions, expressed as the average error across the specified process density range
change in output of a point level measuring device caused by a change in process density with respect to reference conditions, expressed as the maximum error across the specified process density range
change in output of a point level measuring device caused by a change in the process relative permittivity with respect to reference conditions, expressed as the average error across the specified process relative permittivity range
change in output of a point level measuring device caused by a change in the process relative permittivity with respect to reference conditions, expressed as the maximum error across the specified process relative permittivity range
change in output of a point level measuring device caused by a change in the process electrical conductivity with respect to reference conditions, expressed as the average error across the specified process electrical conductivity range
change in output of a point level measuring device caused by a change in the process electrical conductivity with respect to reference conditions, expressed as the maximum error across the specified process electrical conductivity range
change in output of a point level measuring device caused by a change in the process dynamic viscosity with respect to reference conditions, expressed as the average error across the specified process dynamic viscosity range
change in output of a point level measuring device caused by a change in the process dynamic viscosity with respect to reference conditions, expressed as the maximum error across the specified process dynamic viscosity range
Subclasses#
No subclasses
This class is a leaf — no other classes inherit from it.
Metadata#
- Version
- 1
- Revision
- 1
- Status
- Standard
- Publisher
- IEC
- Published in
- IEC 61987
- Responsible committee
- SC65E – IEC 61987
- Change request
C00018- Dates
- Original: 2018-03-28
- Current version: 2018-03-28
- Current revision: 2018-03-28
Full source data#
Every key from the original .xls export, including multilingual variants, status, publisher, committee, and workbook-specific codes.
Raw properties (22 keys from source .xls) — click to expand
- C002
- C00018
- C011
- IEC
- C012
- IEC 61987
- C016
- Standard
- C017.de
- 0
- C018.de
- 2014-12-17
- C019.de
- Mr. W. Hartmann
- MDC_P001_5
- 0112/2///61987#ABE984
- MDC_P002_1
- 1
- MDC_P002_2
- 1
- MDC_P003_0
- 2018-03-28
- MDC_P003_1
- 2018-03-28
- MDC_P003_2
- 2018-03-28
- MDC_P003_3
- 2018-03-28
- MDC_P004.de
- Einfluss der externen Größen für Grenzstand
- MDC_P004.en
- Influence of external quantities expressed for point level
- MDC_P006.de
- Merkmale, die den Einfluss von externen Größen auf die Grenzstandmesseinrichtung kennzeichnen, die nicht Gegenstand der Messung sind, aber deren Änderung die Beziehung zwischen Messergebnis und Anzeige beeinflusst
- MDC_P006.en
- properties characterizing the influence of external quantities for point level measurement devices that are not the subject of the measurement but whose change affects the relationship between the indication and the result of the measurement
- MDC_P010
- 0112/2///61987#ABV501
- MDC_P011
- ITEM_CLASS
- MDC_P012
- SC65E – IEC 61987
- MDC_P014
- {0112/2///61987#ABE985,0112/2///61987#ABE986,0112/2///61987#ABE987,0112/2///61987#ABE988,0112/2///61987#ABE989,0112/2///61987#ABE990,0112/2///61987#ABF006,0112/2///61987#ABF007,0112/2///61987#ABF008,0112/2///61987#ABF009,0112/2///61987#ABF010,0112/2///61987#ABF011,0112/2///61987#ABF012,0112/2///61987#ABF013}
Version history1#
IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.