Influence of external quantities expressed as a percentage [4]
properties characterizing the influence of external quantities on the accuracy of the device
Hierarchy#
Ancestors (top) → ABG314 (highlighted) → subclasses and powertype instances. Capped at 12 each; see the full lists in the sections below.
Higher level classes3#
Declared properties49#
change in output caused by a change in supply voltage with respect to reference conditions, expressed as the maximum error within the specified voltage range
change in output caused by a change in ambient temperature with respect to reference conditions, expressed as the average error across the specified ambient temperature range
basis for stating an average percentage influence of ambient temperature
change in output caused by a change in ambient temperature with respect to reference conditions, expressed as the maximum error within the specified ambient temperature range
basis for stating a maximum percentage influence of ambient temperature
@number of ambient temperature influences at selected test points
change in output caused by a change in process temperature with respect to reference conditions, expressed as the average error across the specified process temperature range
basis for stating an average influence of process temperature
change in output caused by a change in process temperature with respect to reference conditions, expressed as the maximum error within the specified process temperature range
basis for stating a maximum influence of process temperature
@number of process temperature influences at selected test points
change in output caused by a change in process pressure with respect to reference conditions, expressed as the average error across the specified process pressure range
basis for stating an average percentage influence of process pressure
change in output caused by a change in process pressure with respect to reference conditions, expressed as the maximum error within the specified process pressure range
basis for stating a maximum percentage influence of process pressure
@number of process pressure influences at selected test points
cardinality property for humidity influence at selected test points
change in zero or lower range value caused by vibration, as the result of a vibration test
ABB693reference base for maximum influence of vibration on zero or lower range valueENUM_STRING_TYPEbasis for stating a maximum percentage influence of vibration on zero or lower range value
change in output caused by vibration, as the result of a vibration test
basis for stating a maximum influence of vibration
change in output caused by a shock, as the result of a shock test
basis for stating a maximum influence of shock
change in zero or lower range value caused by a change in the device orientation, expressed as the maximum error at a specified mounting angle
change in output span caused by a change in the device orientation with respect to reference conditions, expressed as the maximum error at a specified mounting angle
angle at which a device was mounted in order to determine an influence of the mounting position
change in zero or lower range value caused by a change in load with respect to reference conditions, expressed as the maximum error within the load range
change in output span caused by a change in load with respect to reference conditions, expressed as the maximum error within the load range
change in zero or lower range value caused by a change in supply voltage with respect to reference conditions, expressed as the maximum error within the specified supply voltage range
change in output caused by a change in supply voltage with respect to reference conditions, expressed as the maximum error within the specified supply voltage range
change in output caused by a change in Reynolds number with respect to reference conditions, expressed as the maximum error within the specified Reynolds Number range
basis for stating an influence of Reynolds number
change in output caused by a change in flow with respect to reference conditions, expressed as the maximum error within the specified flow range
basis for stating a maximum influence of flow
@number of influences of electromagnetic interference for a specific quantity
basis for stating an effect of supply voltage
ABC904reference to Influence of ambient temperature at selected test pointCLASS_REFERENCE_TYPE(0112/2///61987#ABC274)reference to block ABC274
ABC905reference to Influence of electromagnetic interferenceCLASS_REFERENCE_TYPE(0112/2///61987#ABC275)reference to block ABC275
ABC914reference to Influence of humidity at selected test pointCLASS_REFERENCE_TYPE(0112/2///61987#ABC284)reference to block ABC284
ABC915reference to Influence of process pressure at selected test pointCLASS_REFERENCE_TYPE(0112/2///61987#ABC285)reference to block ABC285
ABC916reference to Influence of process temperature at selected test pointCLASS_REFERENCE_TYPE(0112/2///61987#ABC286)reference to block ABC286
change in output caused by a change in volume flow rate with respect to reference conditions, expressed as the average error across the specified volume flow rate range
basis for stating an average percentage influence of volume flow rate
change in output caused by a change in dynamic viscosity with respect to reference conditions, expressed as the maximum error within the specified dynamic viscosity range
basis for stating a maximum percentage influence of volume flow rate
change in output caused by a change in dynamic viscosity with respect to reference conditions, expressed as the average error across the specified dynamic viscosity range
basis for stating an average percentage influence of dynamic viscosity
change in output caused by a change in volume flow rate with respect to reference conditions, expressed as the maximum error within the specified volume flow rate range
basis for stating a maximum percentage influence of dynamic viscosity
Subclasses#
No subclasses
This class is a leaf — no other classes inherit from it.
Metadata#
- Version
- 2
- Revision
- 1
- Status
- Standard
- Publisher
- IEC
- Published in
- IEC 61987
- Responsible committee
- IEC/SC 65E
- Change request
C00112- Dates
- Original: 2017-12-07
- Current version: 2022-12-09
- Current revision: 2022-12-09
Full source data#
Every key from the original .xls export, including multilingual variants, status, publisher, committee, and workbook-specific codes.
Raw properties (28 keys from source .xls) — click to expand
- C002
- C00112
- C011
- IEC
- C012
- IEC 61987
- C016
- Standard
- C017.de
- 1
- C017.fr
- 0
- C018.de
- 2021-08-12
- C018.fr
- 2014-12-17
- C019.de
- Mr. W. Hartmann
- C019.fr
- UTE
- MDC_P001_5
- 0112/2///61987#ABG314
- MDC_P002_1
- 2
- MDC_P002_2
- 1
- MDC_P003_0
- 2022-12-09
- MDC_P003_1
- 2017-12-07
- MDC_P003_2
- 2022-12-09
- MDC_P003_3
- 2022-12-09
- MDC_P004.de
- Einfluss der externen Größen in relativen Einheiten [4]
- MDC_P004.en
- Influence of external quantities expressed as a percentage [4]
- MDC_P004.fr
- Influence de grandeurs externes exprimée en pourcentage pour la pression
- MDC_P006.de
- Eigenschaften, die den Einfluss externer Größen auf die Genauigkeit des Geräts charakterisieren
- MDC_P006.en
- properties characterizing the influence of external quantities on the accuracy of the device
- MDC_P006.fr
- propriétés caractérisant l’influence de grandeurs externes sur la pression qui ne sont pas l'objet de la mesure mais dont le changement affecte la relation entre l’indication et le résultat de la mesure
- MDC_P010
- 0112/2///61987#ABV501
- MDC_P011
- ITEM_CLASS
- MDC_P012
- IEC/SC 65E
- MDC_P014
- {0112/2///61987#ABB664,0112/2///61987#ABB665,0112/2///61987#ABB666,0112/2///61987#ABB667,0112/2///61987#ABB672,0112/2///61987#ABB673,0112/2///61987#ABB674,0112/2///61987#ABB675,0112/2///61987#ABB680,0112/2///61987#ABB681,0112/2///61987#ABB682,0112/2///61987#ABB683,0112/2///61987#ABF574,0112/2///61987#ABF575,0112/2///61987#ABF580,0112/2///61987#ABF577,0112/2///61987#ABF578,0112/2///61987#ABF579,0112/2///61987#ABF576,0112/2///61987#ABF581,0112/2///61987#ABB668,0112/2///61987#ABC904,0112/2///61987#ABB676,0112/2///61987#ABC916,0112/2///61987#ABB684,0112/2///61987#ABC915,0112/2///61987#ABB688,0112/2///61987#ABC914,0112/2///61987#ABB692,0112/2///61987#ABB693,0112/2///61987#ABB694,0112/2///61987#ABB695,0112/2///61987#ABB696,0112/2///61987#ABB697,0112/2///61987#ABB698,0112/2///61987#ABB699,0112/2///61987#ABB700,0112/2///61987#ABB701,0112/2///61987#ABB703,0112/2///61987#ABB704,0112/2///61987#ABB706,0112/2///61987#ABB518,0112/2///61987#ABB780,0112/2///61987#ABB707,0112/2///61987#ABB708,0112/2///61987#ABB709,0112/2///61987#ABB710,0112/2///61987#ABB711,0112/2///61987#ABC905}
- MDC_P019
- false
Version history2#
IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.