Normal process conditions [6]
properties characterizing the range of process conditions within which a device is designed to operate within specified performance limits
Hierarchy#
Ancestors (top) → ABG344 (highlighted) → subclasses and powertype instances. Capped at 12 each; see the full lists in the sections below.
Higher level classes3#
Declared properties33#
highest dynamic viscosity for which a device is or should be designed to operate within its specified limits
highest kinematic viscosity for which a device is or should be designed to operate within its specified limits
lowest fluid velocity for which a device is or should be designed to operate within its specified limits
highest fluid velocity for which a device is or should be designed to operate within its specified limits
states of the process material that the device is or should be designed to
highest rate of change of process temperature for which a device is or should be designed to operate within its specified limits
lowest process temperature for which a device is or should be designed to operate within its specified limits
highest process temperature for which a device is or should be designed to operate within its specified limits
lowest absolute pressure of a process for which a device is or should be designed to operate within its specified limits
highest absolute pressure of a process for which a device is or should be designed to operate within its specified limits
lowest electrical conductivity for which a device is or should be designed to operate within its specified limits
lowest thermal conductivity for which a device is or should be designed to operate within its specified limits
lowest actual density for which a device is or should be designed to operate within its specified limits
highest actual density for which a device is or should be designed to operate within its specified limits
lowest Reynolds number for which a device is or should be designed to operate within its specified limits
highest Reynolds number for which a device is or should be designed to operate within its specified limits
highest gas volume fraction for which a device is or should be designed to operate within its specified limits
lowest gauge pressure of a process for which a device is or should be designed to operate within its specified limits
highest gauge pressure of a process for which a device is or should be designed to operate within its specified limits
lowest velocity of sound for which a device is or should be designed to operate within its specified limits
highest velocity of sound for which a device is or should be designed to operate within its specified limits
highest electrical conductivity for which a device is or should be designed to operate within its specified limits
highest thermal conductivity for which a device is or should be designed to operate within its specified limits
lowest gas volume fraction for which a device is or should be designed to operate within its specified limits
lowest relative permittivity for which a device is or should be designed to operate within its specified limits
smallest particle size for which a device is or should be designed to operate within its specified limits
greatest particle size for which a device is or should be designed to operate within its specified limits
highest relative permittivity for which a device is or should be designed to operate within its specified limits
highest rate of level change for which a device is or should be designed to operate within its specified limits
lowest relative permittivity for which a device is or must be designed to operate within its specified limits if used in a stilling well
highest relative permittivity for which a device is or must be designed to operate within its specified limits if used in a stilling well
minimum height of a liquid layer so that a device or a device component operates within its specification
permittivity for which the minimum thickness of upper liquid layer is stated
Subclasses#
No subclasses
This class is a leaf — no other classes inherit from it.
Metadata#
- Version
- 2
- Revision
- 1
- Status
- Standard
- Publisher
- IEC
- Published in
- IEC 61987
- Responsible committee
- SC65E – IEC 61987
- Change request
C00091- Dates
- Original: 2017-12-07
- Current version: 2020-02-24
- Current revision: 2020-02-24
Full source data#
Every key from the original .xls export, including multilingual variants, status, publisher, committee, and workbook-specific codes.
Raw properties (27 keys from source .xls) — click to expand
- C002
- C00091
- C011
- IEC
- C012
- IEC 61987
- C016
- Standard
- C017.de
- 0
- C017.fr
- 0
- C018.de
- 2014-12-17
- C018.fr
- 2014-12-17
- C019.de
- Mr. W. Hartmann
- C019.fr
- UTE
- MDC_P001_5
- 0112/2///61987#ABG344
- MDC_P002_1
- 2
- MDC_P002_2
- 1
- MDC_P003_0
- 2020-02-24
- MDC_P003_1
- 2017-12-07
- MDC_P003_2
- 2020-02-24
- MDC_P003_3
- 2020-02-24
- MDC_P004.de
- Prozessbedingungen (Normalbedingungen)
- MDC_P004.en
- Normal process conditions [6]
- MDC_P004.fr
- Conditions de processus normales
- MDC_P006.de
- Merkmale, die den Bereich der Prozessbedingungen kennzeichnen, für die ein Gerät ausgelegt ist, damit es innerhalb der spezifizierten Grenzen arbeitet
- MDC_P006.en
- properties characterizing the range of process conditions within which a device is designed to operate within specified performance limits
- MDC_P006.fr
- propriétés caractérisant l’étendue de conditions de processus dans lesquelles un appareil est conçu pour fonctionner dans les limites de performance spécifiées
- MDC_P010
- 0112/2///61987#ABV501
- MDC_P011
- ITEM_CLASS
- MDC_P012
- SC65E – IEC 61987
- MDC_P014
- {0112/2///61987#ABA954,0112/2///61987#ABB184,0112/2///61987#ABA955,0112/2///61987#ABB185,0112/2///61987#ABA918,0112/2///61987#ABA919,0112/2///61987#ABA598,0112/2///61987#ABB055,0112/2///61987#ABB056,0112/2///61987#ABA110,0112/2///61987#ABA111,0112/2///61987#ABA112,0112/2///61987#ABA114,0112/2///61987#ABB057,0112/2///61987#ABB058,0112/2///61987#ABD422,0112/2///61987#ABD428,0112/2///61987#ABF531,0112/2///61987#ABF532,0112/2///61987#ABB027,0112/2///61987#ABB233,0112/2///61987#ABB035,0112/2///61987#ABB259,0112/2///61987#ABB231,0112/2///61987#ABB232,0112/2///61987#ABB433,0112/2///61987#ABB059,0112/2///61987#ABD426,0112/2///61987#ABD427,0112/2///61987#ABD429,0112/2///61987#ABA297,0112/2///61987#ABN595,0112/2///61987#ABN596}
Version history2#
IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.