Influence of external quantities expressed for density [2]
properties characterizing the influence of external quantities for density measurement devices that are not the subject of the measurement but whose change affects the relationship between the indication and the result of the measurement
Hierarchy#
Ancestors (top) → ABI411 (highlighted) → subclasses and powertype instances. Capped at 12 each; see the full lists in the sections below.
Higher level classes3#
Declared properties10#
change in output of a density measuring device caused by a change in ambient temperature with respect to reference conditions, expressed as the average error across the specified ambient temperature range
change in output of a density measuring device caused by a change in ambient temperature with respect to reference conditions, expressed as the maximum error within the specified ambient temperature range
change in output of a density measuring device caused by a change in process temperature with respect to reference conditions, expressed as the average error within the specified process temperature range
change in output of a density measuring device caused by a change in process temperature with respect to reference conditions, expressed as the maximum error within the specified process temperature range
change in output of a density measuring device caused by a change in process pressure with respect to reference conditions, expressed as the average error within the specified process pressure range
change in output of a density measuring device caused by a change in process pressure with respect to reference conditions, expressed as the maximum error within the specified process pressure range
change in output of a density measuring device caused by a change in volume flow rate with respect to reference conditions, expressed as the average error across the specified volume flow rate range
change in output of a density measuring device caused by a change in volume flow rate with respect to reference conditions, expressed as the maximum error within the specified volume flow rate range
change in output of a density measuring device caused by a change in dynamic viscosity with respect to reference conditions, expressed as the average error across the specified dynamic viscosity range
change in output of a density measuring device caused by a change in dynamic viscosity with respect to reference conditions, expressed as the maximum error within the specified dynamic viscosity range
Subclasses#
No subclasses
This class is a leaf — no other classes inherit from it.
Metadata#
- Version
- 1
- Revision
- 1
- Status
- Standard
- Responsible committee
- SC65E – IEC 61987
- Change request
C00018- Dates
- Original: 2018-03-28
- Current version: 2018-03-28
- Current revision: 2018-03-28
Full source data#
Every key from the original .xls export, including multilingual variants, status, publisher, committee, and workbook-specific codes.
Raw properties (20 keys from source .xls) — click to expand
- C002
- C00018
- C016
- Standard
- C017.de
- 0
- C018.de
- 2016-02-05
- C019.de
- Mr. W. Hartmann
- MDC_P001_5
- 0112/2///61987#ABI411
- MDC_P002_1
- 1
- MDC_P002_2
- 1
- MDC_P003_0
- 2018-03-28
- MDC_P003_1
- 2018-03-28
- MDC_P003_2
- 2018-03-28
- MDC_P003_3
- 2018-03-28
- MDC_P004.de
- Einfluss der externen Größen auf Dichtemessung
- MDC_P004.en
- Influence of external quantities expressed for density [2]
- MDC_P006.de
- Merkmale, die den Einfluss von externen Größen auf die Dichtemesseinrichtung kennzeichnen, die nicht Gegenstand der Messung sind, aber deren Änderung die Beziehung zwischen Messergebnis und Anzeige beeinflusst
- MDC_P006.en
- properties characterizing the influence of external quantities for density measurement devices that are not the subject of the measurement but whose change affects the relationship between the indication and the result of the measurement
- MDC_P010
- 0112/2///61987#ABV501
- MDC_P011
- ITEM_CLASS
- MDC_P012
- SC65E – IEC 61987
- MDC_P014
- {0112/2///61987#ABB807,0112/2///61987#ABB808,0112/2///61987#ABB809,0112/2///61987#ABB810,0112/2///61987#ABB811,0112/2///61987#ABB812,0112/2///61987#ABF582,0112/2///61987#ABF583,0112/2///61987#ABF584,0112/2///61987#ABF585}
Version history1#
IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.