Absolute performance for temperature [I/O module]
properties characterizing the accuracy of a temperature measurement of an I/O module, expressed in engineering units
Hierarchy#
Ancestors (top) → ABP011 (highlighted) → subclasses and powertype instances. Capped at 12 each; see the full lists in the sections below.
Higher level classes3#
Declared properties14#
quality which characterizes the ability of a temperature measuring instrument to provide an indicated value close to a true value of the measurand under reference conditions
largest positive or negative value of error of the average upscale or downscale value at each point of temperature measurement expressed as an absolute value
equation from which the measured error of a device can be calculated
absolute error of a device measuring temperature under reference conditions, when the input is at the lower range value
for a temperature measurement, maximum positive and negative deviation from the specified characteristic curve observed in testing a device under specified conditions and by a specified procedure
algebraic difference between the extreme values obtained by a number of consecutive measurements of the output over a short period of time for the same value of the input under the same operating conditions, approaching from the same direction, for full range traverses of temperature
equation from which the non-repeatability of a device can be calculated
additional percentage error to be added to the measured error of a measured value
basis for stating an additional error for analog output
reference to block ABC210
reference to block ABC324
probability, generally expressed as a percentage, that the true value of a statistically estimated quantity falls within a pre-established interval about the estimated value
for a temperature measurement, maximum positive and negative deviation from the specified characteristic curve observed in testing a device under specified conditions and by a specified procedure resulting from a reference junction compensation
ABP246ref. Influence of external quantities expressed for temperature [I/O module]CLASS_REFERENCE_TYPE(0112/2///61987#ABP042)reference to block ABP042
Subclasses#
No subclasses
This class is a leaf — no other classes inherit from it.
Metadata#
- Version
- 1
- Revision
- 1
- Status
- Standard
- Publisher
- IEC
- Published in
- IEC 61987
- Responsible committee
- IEC/SC 65E
- Change request
C00128- Dates
- Original: 2023-01-23
- Current version: 2023-01-23
- Current revision: 2023-01-23
Full source data#
Every key from the original .xls export, including multilingual variants, status, publisher, committee, and workbook-specific codes.
Raw properties (23 keys from source .xls) — click to expand
- C002
- C00128
- C011
- IEC
- C012
- IEC 61987
- C016
- Standard
- C017.de
- 0
- C018.de
- 2021-11-23
- C019.de
- Mr. W. Hartmann
- MDC_P001_5
- 0112/2///61987#ABP011
- MDC_P002_1
- 1
- MDC_P002_2
- 1
- MDC_P003_0
- 2023-01-23
- MDC_P003_1
- 2023-01-23
- MDC_P003_2
- 2023-01-23
- MDC_P003_3
- 2023-01-23
- MDC_P004.de
- Leistungsdaten für Temperatur in absoluten Einheiten [I/O-Modul]
- MDC_P004.en
- Absolute performance for temperature [I/O module]
- MDC_P006.de
- Merkmale, die die Genauigkeit einer Temperaturmessung eines I/O-Moduls, ausgedrückt in physikalischen Einheiten, kennzeichnen
- MDC_P006.en
- properties characterizing the accuracy of a temperature measurement of an I/O module, expressed in engineering units
- MDC_P010
- 0112/2///61987#ABV501
- MDC_P011
- ITEM_CLASS
- MDC_P012
- IEC/SC 65E
- MDC_P014
- {0112/2///61987#ABB216,0112/2///61987#ABD535,0112/2///61987#ABB217,0112/2///61987#ABB749,0112/2///61987#ABB747,0112/2///61987#ABB772,0112/2///61987#ABP113,0112/2///61987#ABB519,0112/2///61987#ABB774,0112/2///61987#ABB775,0112/2///61987#ABB776,0112/2///61987#ABP246,0112/2///61987#ABC840,0112/2///61987#ABC954}
- MDC_P019
- false
Version history1#
IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.