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classITEM_CLASSv1rev 12023-01-23

Reference device conditions [I/O module]

0112/2///61987#ABP067

properties characterizing the reference conditions of an I/O module under which the performance of a device was tested

Properties
6
Subclasses
0

Hierarchy#

ABA000 Equipment for industr… ABV001 Libraries ABV501 Block ABP067 Reference device cond… ABP067 Reference device cond…

Ancestors (top) → ABP067 (highlighted) → subclasses and powertype instances. Capped at 12 each; see the full lists in the sections below.

Higher level classes3#

Declared properties6#

ABB647reference warm-up timeLEVEL(MIN,NOM,MAX) OF REAL_MEASURE_TYPE

warm-up time of the device after which the performance of a device was tested

ABB649reference supply voltageLEVEL(MIN,NOM,MAX) OF REAL_MEASURE_TYPE

supply voltage with which the performance of a device was tested

ABB650reference electrical loadLEVEL(MIN,NOM,MAX) OF REAL_MEASURE_TYPE

output load at which the performance of a device was tested

Subclasses#

No subclasses

This class is a leaf — no other classes inherit from it.

Metadata#

Version
1
Revision
1
Status
Standard
Publisher
IEC
Published in
IEC 61987
Responsible committee
IEC/SC 65E
Change request
C00128
Dates
  • Original: 2023-01-23
  • Current version: 2023-01-23
  • Current revision: 2023-01-23

Full source data#

Every key from the original .xls export, including multilingual variants, status, publisher, committee, and workbook-specific codes.

Raw properties (23 keys from source .xls) — click to expand
C002
C00128
C011
IEC
C012
IEC 61987
C016
Standard
C017.de
0
C018.de
2021-11-23
C019.de
Mr. W. Hartmann
MDC_P001_5
0112/2///61987#ABP067
MDC_P002_1
1
MDC_P002_2
1
MDC_P003_0
2023-01-23
MDC_P003_1
2023-01-23
MDC_P003_2
2023-01-23
MDC_P003_3
2023-01-23
MDC_P004.de
Referenz-Gerätebedingungen [I/O-Modul]
MDC_P004.en
Reference device conditions [I/O module]
MDC_P006.de
Merkmale, die die Referenzgrößen eines I/O-Moduls kennzeichnen, bei denen die Leistung des Geräts bestimmt wurde
MDC_P006.en
properties characterizing the reference conditions of an I/O module under which the performance of a device was tested
MDC_P010
0112/2///61987#ABV501
MDC_P011
ITEM_CLASS
MDC_P012
IEC/SC 65E
MDC_P014
{0112/2///61987#ABB647,0112/2///61987#ABB649,0112/2///61987#ABB650,0112/2///61987#ABB799,0112/2///61987#ABC889,0112/2///61987#ABB278}
MDC_P019
false

Version history1#

  1. Current rev 01
    23 Jan 2023 · 14:53 UTC by BATCH 00000807
    View on cdd.iec.ch ↗

IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.