Normal process design conditions [process analyser]
properties characterizing the normal range of process conditions for which a process analyser shall be designed and operate within its specifications
Hierarchy#
Ancestors (top) → ABP866 (highlighted) → subclasses and powertype instances. Capped at 12 each; see the full lists in the sections below.
Higher level classes3#
Declared properties29#
highest dynamic viscosity for which a device is or should be designed to operate within its specified limits
highest fluid velocity for which a device is or should be designed to operate within its specified limits
dynamic viscosity on the basis of which a pressure drop statement is valid
states of the process material that the device is or should be designed to
highest rate of change of process temperature for which a device is or should be designed to operate within its specified limits
lowest process temperature for which a device is or should be designed to operate within its specified limits
highest process temperature for which a device is or should be designed to operate within its specified limits
lowest absolute pressure of a process for which a device is or should be designed to operate within its specified limits
highest absolute pressure of a process for which a device is or should be designed to operate within its specified limits
lowest electrical conductivity for which a device is or should be designed to operate within its specified limits
lowest thermal conductivity for which a device is or should be designed to operate within its specified limits
lowest actual density for which a device is or should be designed to operate within its specified limits
highest actual density for which a device is or should be designed to operate within its specified limits
highest gas volume fraction for which a device is or should be designed to operate within its specified limits
lowest gauge pressure of a process for which a device is or should be designed to operate within its specified limits
highest gauge pressure of a process for which a device is or should be designed to operate within its specified limits
lowest velocity of sound for which a device is or should be designed to operate within its specified limits
highest velocity of sound for which a device is or should be designed to operate within its specified limits
highest electrical conductivity for which a device is or should be designed to operate within its specified limits
highest thermal conductivity for which a device is or should be designed to operate within its specified limits
highest mass flow rate for which a device is or should be designed to operate within its specified limits
highest actual volume flow rate for which a device is or should be designed to operate within its specified limits
highest normalized flow rate for which a device is or should be designed to operate within its specified limits
highest permanent loss of pressure over the primary element at upper range-limit of flow rate
lowest gas volume fraction for which a device is or should be designed to operate within its specified limits
lowest solids content expressed as mass fraction for which a device is or should be designed to operate within its specified limits
highest solids content expressed as mass fraction for which a device is or should be designed to operate within its specified limits
smallest particle size for which a device is or should be designed to operate within its specified limits
greatest particle size for which a device is or should be designed to operate within its specified limits
Subclasses#
No subclasses
This class is a leaf — no other classes inherit from it.
Metadata#
- Version
- 1
- Revision
- 1
- Status
- Standard
- Publisher
- IEC
- Published in
- IEC 61987
- Responsible committee
- IEC/SC 65E
- Change request
C00172- Dates
- Original: 2025-02-24
- Current version: 2025-02-24
- Current revision: 2025-02-24
Full source data#
Every key from the original .xls export, including multilingual variants, status, publisher, committee, and workbook-specific codes.
Raw properties (23 keys from source .xls) — click to expand
- C002
- C00172
- C011
- IEC
- C012
- IEC 61987
- C016
- Standard
- C017.de
- 0
- C018.de
- 2022-08-22
- C019.de
- Mr. W. Hartmann
- MDC_P001_5
- 0112/2///61987#ABP866
- MDC_P002_1
- 1
- MDC_P002_2
- 1
- MDC_P003_0
- 2025-02-24
- MDC_P003_1
- 2025-02-24
- MDC_P003_2
- 2025-02-24
- MDC_P003_3
- 2025-02-24
- MDC_P004.de
- Prozessauslegungsbedingungen (Normalbedingungen für Prozessanalysengeräte)
- MDC_P004.en
- Normal process design conditions [process analyser]
- MDC_P006.de
- Merkmale, die den Normalbereich der Prozessbedingungen kennzeichnen, für die ein Prozessanalysengerät auszulegen ist und innerhalb deren Spezifikationen es betrieben wird
- MDC_P006.en
- properties characterizing the normal range of process conditions for which a process analyser shall be designed and operate within its specifications
- MDC_P010
- 0112/2///61987#ABV501
- MDC_P011
- ITEM_CLASS
- MDC_P012
- IEC/SC 65E
- MDC_P014
- {0112/2///61987#ABA954,0112/2///61987#ABB184,0112/2///61987#ABA955,0112/2///61987#ABB185,0112/2///61987#ABA918,0112/2///61987#ABA919,0112/2///61987#ABA598,0112/2///61987#ABB329,0112/2///61987#ABB330,0112/2///61987#ABB331,0112/2///61987#ABB055,0112/2///61987#ABB056,0112/2///61987#ABA110,0112/2///61987#ABA114,0112/2///61987#ABB027,0112/2///61987#ABB233,0112/2///61987#ABB035,0112/2///61987#ABB259,0112/2///61987#ABB231,0112/2///61987#ABB232,0112/2///61987#ABB433,0112/2///61987#ABB059,0112/2///61987#ABB434,0112/2///61987#ABB435,0112/2///61987#ABD426,0112/2///61987#ABD427,0112/2///61987#ABB332,0112/2///61987#ABA116,0112/2///61987#ABA297}
- MDC_P019
- false
Version history1#
IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.