wafer mapv2rev 72011-02-15IEC 62258
wafer map
0112/2///61360_4#AAD187
reference to a document or file that contains either a map of a wafer containing die devices, indicating the quality or performance levels of each, or a key to the corresponding marks used on the die on the wafer itself
- Used by classes
- 1
Also appears in1#
Entities with the same name in other dictionaries:
- Code
AAD187- Data type
- STRING_TYPE
All properties21#
- Version
- 2
- Revision
- 7
- Preferred name
- wafer map
- Short name
- wafer map
- Definition
- reference to a document or file that contains either a map of a wafer containing die devices, indicating the quality or performance levels of each, or a key to the corresponding marks used on the die on the wafer itself
- Definition source
- IEC 62258
- Definition class
- 0112/2///61360_4#AAA001component
- Drawing reference
- M..255
- Responsible committee
- IEC/TC 47
- Publisher
- IEC
- Published in
- IEC 61360-4
- Published in
- NON_DEPENDENT_P_DET
- Status level
- Standard
- Version release date
- 2024-12-21
- Revision release date
- 2011-02-15
- Version initiation date
- 2024-12-21
- Original definition date
- 2006-11-10
- Change request ID
- C00162
- MDC_P001_6
- 0112/2///61360_4#AAD187wafer map
- MDC_P022
- STRING_TYPE
- MDC_P040
- A61