@T_jv1rev 62011-08-31IEC 60747-1 (IV.5.2.3) (1983)
junction temperature
0112/2///61360_4#AAE271
temperature of the active region in which the major part of the heat is generated of a transistor, diode, trigger device, optoelectronic device or IC as a variable
propertyAlso appears in3#
Entities with the same name in other dictionaries:
- Code
AAE271- Data type
- INTEGER_MEASURE_TYPEmeasure
- Unit
- UAA033 UAA033
All properties23#
- Version
- 1
- Revision
- 6
- Preferred name
- junction temperature
- Short name
- @T_j
- Definition
- temperature of the active region in which the major part of the heat is generated of a transistor, diode, trigger device, optoelectronic device or IC as a variable
- Definition source
- IEC 60747-1 (IV.5.2.3) (1983)
- Definition class
- 0112/2///61360_4#AAA001component
- Unit structure
- °C
- Drawing reference
- NR1 S..4
- Initial value
- 0112/2///62720#UAA033 UAA033
- Responsible committee
- SC3D
- Publisher
- IEC
- Published in
- IEC 61360-4
- Published in
- CONDITION_DET
- Status level
- Standard
- Version release date
- 2019-11-19
- Revision release date
- 2011-08-31
- Version initiation date
- 2019-11-19
- Original definition date
- 2008-02-21
- MDC_P022
- INT_MEASURE_TYPE
- MDC_P025_1
- @T_j}
- MDC_P040
- H02