T_stress(junc)v2rev 52011-02-15
junction stress temperature
0112/2///61360_4#AAF275
nominal junction temperature of a transistor, diode, trigger device, optoelectronic device or integrated circuit during stress
- Used by classes
- 4
Also appears in1#
Entities with the same name in other dictionaries:
- Code
AAF275- Data type
- LEVEL(NOM) OF INT_MEASURE_TYPE
- Unit
- UAA033 UAA033
All properties22#
- Version
- 2
- Revision
- 5
- Preferred name
- junction stress temperature
- Short name
- T_stress(junc)
- Definition
- nominal junction temperature of a transistor, diode, trigger device, optoelectronic device or integrated circuit during stress
- Definition class
- 0112/2///61360_4#AAA001component
- Unit structure
- °C
- Drawing reference
- NR1..4
- Initial value
- 0112/2///62720#UAA033 UAA033
- Responsible committee
- IEC/SC 3D
- Publisher
- IEC
- Published in
- IEC 61360-4
- Published in
- NON_DEPENDENT_P_DET
- Status level
- Standard
- Version release date
- 2024-12-21
- Revision release date
- 2011-02-15
- Version initiation date
- 2015-08-17
- Original definition date
- 2001-10-08
- MDC_P022
- LEVEL(NOM) OF INT_MEASURE_TYPE
- MDC_P025_1
- T_stress(junc)}
- MDC_P040
- H02