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T_stress(junc)v2rev 52011-02-15

junction stress temperature

0112/2///61360_4#AAF275

nominal junction temperature of a transistor, diode, trigger device, optoelectronic device or integrated circuit during stress

Used by classes
4
property
Code
AAF275
Data type
LEVEL(NOM) OF INT_MEASURE_TYPE
Unit
UAA033 UAA033
Used by classes (4)

Version history4#

  1. Current rev 05
    21 Dec 2024 · 18:46 UTC by BATCH 00001336
    View on cdd.iec.ch ↗
  2. superseded rev 04
    23 Jul 2015 · 11:08 UTC by BATCH 00000907
    ↓ Version JSON
    View on cdd.iec.ch ↗
  3. superseded rev 03
    22 Jul 2015 · 14:21 UTC by BATCH 00000904
    ↓ Version JSON
    View on cdd.iec.ch ↗
  4. superseded rev 02
    27 Apr 2011 · 14:07 UTC by BATCH 00000704
    ↓ Version JSON
    View on cdd.iec.ch ↗

IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.

Metadata#

Version
2
Revision
5
Status
Standard
Publisher
IEC
Published in
IEC 61360-4
Responsible committee
IEC/SC 3D
Dates
  • Original: 2001-10-08
  • Current version: 2011-02-15
  • Current revision: 2015-08-17