T_stress(junc)v2rev 52011-02-15

junction stress temperature

0112/2///61360_4#AAF275

nominal junction temperature of a transistor, diode, trigger device, optoelectronic device or integrated circuit during stress

Used by classes: 4

property

Also appears in1#

Entities with the same name in other dictionaries:

iec-61360-4AAF275Propertie

Code: AAF275
Data type: LEVEL(NOM) OF INT_MEASURE_TYPE
Unit: UAA033 UAA033

Used by classes (4)

Version history4#

IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.

All properties22#

Version: 2
Revision: 5
Preferred name: junction stress temperature
Short name: T_stress(junc)
Definition: nominal junction temperature of a transistor, diode, trigger device, optoelectronic device or integrated circuit during stress
Definition class: 0112/2///61360_4#AAA001component
Unit structure: °C
Drawing reference: NR1..4
Initial value: 0112/2///62720#UAA033 UAA033
Responsible committee: IEC/SC 3D
Publisher: IEC
Published in: IEC 61360-4
Published in: NON_DEPENDENT_P_DET
Status level: Standard
Version release date: 2024-12-21
Revision release date: 2011-02-15
Version initiation date: 2015-08-17
Original definition date: 2001-10-08
MDC_P001_6: 0112/2///61360_4#AAF275junction stress temperature
MDC_P022: LEVEL(NOM) OF INT_MEASURE_TYPE
MDC_P025_1: T_stress(junc)}
MDC_P040: H02