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Ev2rev 52011-02-15IEC 62258

die step dimension y

0112/2///61360_4#AAD071

nominal value of the step interval of die patterns on a wafer measured in the direction of the y axis of the coordinate system established for the wafer

Used by classes
1
property
Code
AAD071
Data type
LEVEL(NOM) OF REAL_MEASURE_TYPE
Unit
UAA726 UAA726
Used by classes (1)

Version history4#

  1. Current rev 05
    17 Aug 2015 · 15:40 UTC by BATCH 00000917
    View on cdd.iec.ch ↗
  2. superseded rev 04
    23 Jul 2015 · 11:08 UTC by BATCH 00000907
    ↓ Version JSON
    View on cdd.iec.ch ↗
  3. superseded rev 03
    22 Jul 2015 · 14:21 UTC by BATCH 00000904
    ↓ Version JSON
    View on cdd.iec.ch ↗
  4. superseded rev 02
    27 Apr 2011 · 14:07 UTC by BATCH 00000704
    ↓ Version JSON
    View on cdd.iec.ch ↗

IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.

Metadata#

Remark
The width of the die will normally be closely related to the step interval but the precise value depends on width of saw cuts, tolerances etc.
Source document
IEC 62258
Version
2
Revision
5
Status
Standard
Publisher
IEC
Published in
IEC 61360-4
Responsible committee
SC3D
Dates
  • Original: 2003-02-21
  • Current version: 2011-02-15
  • Current revision: 2015-08-17