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n_die(waf)v2rev 52011-02-15IEC 62258

wafer gross die count

0112/2///61360_4#AAD165

nominal gross number of whole and viable die on a wafer

Used by classes
1
property
Code
AAD165
Data type
LEVEL(NOM) OF INT_MEASURE_TYPE
Unit
UAA915 UAA915
Used by classes (1)

Version history4#

  1. Current rev 05
    17 Aug 2015 · 15:40 UTC by BATCH 00000917
    View on cdd.iec.ch ↗
  2. superseded rev 04
    23 Jul 2015 · 11:08 UTC by BATCH 00000907
    ↓ Version JSON
    View on cdd.iec.ch ↗
  3. superseded rev 03
    22 Jul 2015 · 14:21 UTC by BATCH 00000904
    ↓ Version JSON
    View on cdd.iec.ch ↗
  4. superseded rev 02
    27 Apr 2011 · 14:07 UTC by BATCH 00000704
    ↓ Version JSON
    View on cdd.iec.ch ↗

IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.

Metadata#

Source document
IEC 62258
Version
2
Revision
5
Status
Standard
Publisher
IEC
Published in
3D/ggg
Responsible committee
SC3D
Dates
  • Original: 2003-04-01
  • Current version: 2011-02-15
  • Current revision: 2015-08-17