index typev2rev 62011-02-15IEC 62258

wafer index orientation

0112/2///61360_4#AAD167

nominal angle between the x-axis for the die and a radius drawn from the centre of the wafer to the mid-point of the index feature

Used by classes: 1

property

Also appears in1#

Entities with the same name in other dictionaries:

iec-61360-4AAD167Propertie

Code: AAD167
Data type: LEVEL(NOM) OF INT_MEASURE_TYPE
Unit: UAA024 UAA024

Used by classes (1)

AAA302die device

Version history4#

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All properties24#

Version: 2
Revision: 6
Preferred name: wafer index orientation
Short name: index type
Definition: nominal angle between the x-axis for the die and a radius drawn from the centre of the wafer to the mid-point of the index feature
Definition source: IEC 62258
Note: The angle shall be given to the nearest degree as a positive integer less than 360 measuring in a clockwise direction from the x-axis of the die
Definition class: 0112/2///61360_4#AAA302die device
Unit structure: °
Drawing reference: NR1..3
Initial value: 0112/2///62720#UAA024 UAA024
Responsible committee: SC3D
Publisher: IEC
Published in: 3D/ggg
Published in: NON_DEPENDENT_P_DET
Status level: Standard
Version release date: 2015-08-17
Revision release date: 2011-02-15
Version initiation date: 2015-08-17
Original definition date: 2003-04-01
MDC_P001_6: 0112/2///61360_4#AAD167wafer index orientation
MDC_P022: LEVEL(NOM) OF INT_MEASURE_TYPE
MDC_P025_1: α
MDC_P040: T01