t_wafer(tol)v2rev 62011-02-15IEC 62258

wafer thickness tolerance

0112/2///61360_4#AAD186

nominal tolerance on the thickness of a semiconductor wafer containing die devices

Used by classes: 1

property

Also appears in1#

Entities with the same name in other dictionaries:

iec-61360-4AAD186Propertie

Code: AAD186
Data type: LEVEL(NOM) OF REAL_MEASURE_TYPE
Unit: UAA726 UAA726

Used by classes (1)

AAA057integrated circuit

Version history5#

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All properties24#

Version: 2
Revision: 6
Preferred name: wafer thickness tolerance
Short name: t_wafer(tol)
Definition: nominal tolerance on the thickness of a semiconductor wafer containing die devices
Definition source: IEC 62258
Definition class: 0112/2///61360_4#AAA001component
Unit structure: m
Drawing reference: NR2..3.3
Initial value: 0112/2///62720#UAA726 UAA726
Responsible committee: IEC/TC 47
Publisher: IEC
Published in: IEC 61360-4
Published in: NON_DEPENDENT_P_DET
Status level: Standard
Version release date: 2024-12-21
Revision release date: 2011-02-15
Version initiation date: 2024-12-21
Original definition date: 2007-02-14
Change request ID: C00162
MDC_P001_6: 0112/2///61360_4#AAD186wafer thickness tolerance
MDC_P022: LEVEL(NOM) OF REAL_MEASURE_TYPE
MDC_P025_1: t_wafer(tol)}
MDC_P040: T03