testability featuresv2rev 62011-02-15

testability features

0112/2///61360_4#AAD207

description and explanation of designed-in testability features which may be needed and appropriate for customer testing of a die device

Used by classes: 1

property

Also appears in1#

Entities with the same name in other dictionaries:

iec-61360-4AAD207Propertie

Code: AAD207
Data type: STRING_TYPE

Used by classes (1)

AAA302die device

Version history4#

IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.

All properties20#

Version: 2
Revision: 6
Preferred name: testability features
Short name: testability features
Definition: description and explanation of designed-in testability features which may be needed and appropriate for customer testing of a die device
Note: Examples of built-in testability features include redundancy, control fuses, error correction, ad-hoc structured boundary scan and built-in self-test. Such information shall only be supplied when it does not infringe the intellectual property rights of the supplier
Definition class: 0112/2///61360_4#AAA302die device
Drawing reference: M..255
Responsible committee: TC47/PT62258
Publisher: IEC 62258
Published in: IEC 61360-4 DB
Published in: NON_DEPENDENT_P_DET
Status level: Standard
Version release date: 2015-08-17
Revision release date: 2011-02-15
Version initiation date: 2015-08-17
Original definition date: 2007-03-02
MDC_P001_6: 0112/2///61360_4#AAD207testability features
MDC_P022: STRING_TYPE
MDC_P040: A59