shelf lifev1rev 52011-08-31IEC 60384-1 (4.25.1) (1982)
shelf life
0112/2///61360_4#AAE041
duration of storage test at specified ambient temperature of a fixed electrolytic capacitor After test and reconditioning the capacitor shall meet stated requirements for change in capacitance, loss angle, dc leakage current, and impedance
- Used by classes
- 1
Also appears in1#
Entities with the same name in other dictionaries:
- Code
AAE041- Data type
- LEVEL(NOM) OF INT_MEASURE_TYPE
- Unit
- UAA525 UAA525
Version history5#
IEC CDD records every published revision of each entity — version number, status, timestamp, and the change request that introduced it. OpenCDD captures the full chain of custody from cdd.iec.ch; the entry marked Current is the one rendered on this page.
All properties25#
- Version
- 1
- Revision
- 5
- Preferred name
- shelf life
- Short name
- shelf life
- Definition
- duration of storage test at specified ambient temperature of a fixed electrolytic capacitor After test and reconditioning the capacitor shall meet stated requirements for change in capacitance, loss angle, dc leakage current, and impedance
- Definition source
- IEC 60384-1 (4.25.1) (1982)
- Remark
- This is a modification of the IEC Dry heat test, with extended duration.
- Definition class
- 0112/2///61360_4#AAA001component
- Unit structure
- h
- Drawing reference
- NR1..4
- Value format
- {0112/2///61360_4#AAE014}
- Initial value
- 0112/2///62720#UAA525 UAA525
- Responsible committee
- SC3D
- Publisher
- IEC
- Published in
- IEC 61360-4
- Published in
- DEPENDENT_P_DET
- Status level
- Standard
- Version release date
- 2015-08-17
- Revision release date
- 2011-08-31
- Version initiation date
- 2015-08-17
- Original definition date
- 1996-08-01
- MDC_P001_6
- 0112/2///61360_4#AAE041shelf life
- MDC_P022
- LEVEL(NOM) OF INT_MEASURE_TYPE
- MDC_P025_1
- shelf life
- MDC_P040
- T07